A new approach involving freeze-drying cells could help improve the
quantitative analysis of secondary-ion mass spectrometry (SIMS) as a method for mapping cells, research has indicated.
Scientists from the National Institute of Standards and Technology (NIST) and the National Cancer Institute have conducted an investigation into the use of a focused ion beam (FIB), which enabled them to take an even layer off a cell, exposing its interior for examination.
The approach is said to be more accurate than using standard SIMS to examine a cell and team leader Christopher Szakal explained the technique provides a "new, extremely data-rich surface for analysis".
He stated the researchers will now work on ascertaining whether the FIB can be used for more than just removing the top layer of a cell, adding 3D images of components will be created if it is possible to "chemically map successive layers of a cell".
NIST, which is part of the US Department of Commerce, was the country's first federal physical science research laboratory, having been founded in 1901.
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