GC, MDGC
Researchers make SIMS cell mapping accuracy 'breakthrough'
Mar 07 2011
Scientists from the National Institute of Standards and Technology (NIST) and the National Cancer Institute have conducted an investigation into the use of a focused ion beam (FIB), which enabled them to take an even layer off a cell, exposing its interior for examination.
The approach is said to be more accurate than using standard SIMS to examine a cell and team leader Christopher Szakal explained the technique provides a "new, extremely data-rich surface for analysis".
He stated the researchers will now work on ascertaining whether the FIB can be used for more than just removing the top layer of a cell, adding 3D images of components will be created if it is possible to "chemically map successive layers of a cell".
NIST, which is part of the US Department of Commerce, was the country's first federal physical science research laboratory, having been founded in 1901.
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